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Abstrakt
Leaf Rust Resistance of 35 Wheat Cultivars (Lines)
Li J, Shi L, Wang X, Zhang N, Wei X, Zhang L, Yang W and Liu D
Wheat leaf rust caused by Puccinia triticina (Pt) is one of most severe fungal diseases threatening global wheat production. Rational utilization of the diversified leaf rust resistance (Lr) in different wheat cultivars is still the most efficient method to control this disease. Here in this study, 35 wheat cultivars collected from China main wheat growth region were tested for their seedling resistance to 16 different Pt races. Seedlings of 20 tested wheat cultivars showed high resistance phenotype to at least one Pt race. Various molecular markers closely linked to fifteen designated Lr genes were applied and only three Lr genes (Lr1, Lr10 and Lr26) were identified in some of the tested cultivars. All cultivars were then inoculated with bulked Pt races mixed with even of 10 pathotypes at adult plant stage to detect the adult plant resistance (APR). Five cultivars including Liangxing 66, Hemai 9735, Luyuan 301, Jimai 17 and Taishan 027 showed typical APR reaction in the field. Our results indicate that the diversity of known Lr genes in the tested wheat cultivars is relative low, but 10 of them contained more durable leaf rust resistance and can be released in wheat production and can be used as resistance breeding resources.